000 00353nam a22001457a 4500
999 _c8769
_d8769
003 OSt
005 20211006135457.0
008 211006b xxu||||| |||| 00| 0 eng d
020 _a9788126505555
100 _aJon Thomas and Matthew Young
245 _aJava/ J2EE Testing Patterns
260 _aNew Delhi
_bWiley
_c2004
300 _a400
942 _2ddc
_cBK